000 00452nam a2200109Ia 4500
008 171212s9999 xx 000 0 und d
100 _aYuan, Kun;Le, Vi-Nhuan
245 _cYuan, Kun;Le, Vi-Nhuan
_aMeasuring Deeper Learning Through Cognitively Demanding Test Items
_bResults from the Analysis of Six National and International Exams
260 _bRAND Corporation
_c2014
650 _aEducation
856 _uhttp://www.jstor.org/stable/10.7249/j.ctt5vjvq3
999 _c352307
_d352307