000 00417nam a2200145Ia 4500
008 170725s9999 xx 000 0 und d
100 _aFan Wu
245 _aMemory mutation testing
245 _cFan Wu, Jay Nanavati, Mark Harman, Yue Jia, Jens Krinke
260 _c2017
300 _apages 97-111, January
440 _aInformation and software technology
_v81:
500 _aCJ0030
650 _aMutation Testing
999 _c340884
_d340884