TY  - BOOK
TI  - Machine learning and biometrics
SN  - 978-1-77469-104-5
AV  - TK 7882.B56 .M33 2022
PY  - 2022///
CY  - Canada
PB  - Arcler Press
KW  - Biometrics (Science)
KW  - Machine learning
KW  - Pattern recognition systems
N1  - Includes bibliographical references and index
ER  -