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  2. MARC view: The dark side of testing memory :
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The dark side of testing memory : (Record no. 121333)

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MARC details
000 -LEADER
fixed length control field 00659nam a2200205Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 140626s9999 xx 000 0 und d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Chan, Jason.
245 #4 - TITLE STATEMENT
Title The dark side of testing memory :
Remainder of title repeated retrieval can enhance eyewitness suggestibility /
Statement of responsibility, etc Jason Chan ... [et al.].
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Date of publication, distribution, etc c2011.
300 ## - PHYSICAL DESCRIPTION
Extent 17 : 4, page 418
440 ## - SERIES STATEMENT/ADDED ENTRY--TITLE
Title Journal of Experimental Psycholgy : Applied
521 ## - TARGET AUDIENCE NOTE
Target audience note
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Eyewitness memory.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Hypercorrection.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Misleading information.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Repeated retrieval.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Retrieval-enhanced suggestibility.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Testing effect.
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Periodicals
Holdings
Withdrawn status Lost status Damaged status Home library Current library Shelving location Date acquired Total Checkouts Barcode Date last seen Price effective from Koha item type
      College Library College Library Periodical Section 06/26/2014   S0441 06/26/2014 06/26/2014 Periodicals

The dark side of testing memory :

APA

Chan J., . (2011). The dark side of testing memory. : .

Chicago

Chan Jason, . 2011. The dark side of testing memory. : .

Harvard

Chan J., . (2011). The dark side of testing memory. : .

MLA

Chan Jason, . The dark side of testing memory. : . 2011.

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SOUTHVILLE LIBRARY

Southville International School and Colleges Library

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Tel. No. 8256374 / 252358 Loc. 117/146

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